Wednesday 24 January 2018 

Speaker: Peter Phillips/Giulio Villani (RAL/PPD)


Title: "Report on the "Hiroshima” Symposium on the Development and Application of Semiconductor Tracking detectors”

Abstract: The eleventh “Hiroshima” Symposium was held from 11th to 15th December 2017 at the Okinawa Institute of Science 
and Technology Graduate University (OIST), Okinawa Island, Japan. The primary goal of the symposium is to bring experts 
in design, processing and applications of semiconductor tracking detectors together for discussions of experiences, 
lessons learned, and new ideas which are still in the early stage of development.  Silicon-On-Insulator (SOI) is a 
multi-layer wafer technology which enables the 3D integration of distinct sensor and readout layers in a truly 
monolithic way. We will introduce the venue and present some of the highlights from a very interesting conference.