Wednesday 20 February 2013 Speaker: John Matheson (RAL/PPD) Title: "Electron Detectors, Old and New" Abstract: Detection of electrons is important for a wide variety of microscopy and materials characterisation techniques, both lab-based and on synchrotron light sources. As part of a feasibility study for X-ray photoelectron emission microscopy, a test system for low-energy electron detectors was built at RAL. This was first used to compare the current standard microchannel plate detector for X-ray photoelectron emission microscopy with a new approach, based on a monolithic active pixel sensor. I shall describe this particular application, the possible detector choices, construction of the test system and present quantitative test results. Conclusions will be drawn concerning detector choices for future instruments.